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. 2022 Dec 21;16(1):50. doi: 10.3390/ma16010050

Vapor Pressure versus Temperature Relations of Common Elements

B Mondal 1, T Mukherjee 1, N W Finch 1, A Saha 2, M Z Gao 2, T A Palmer 1,2, T DebRoy 1,*
Editor: Amir Mostafaei
PMCID: PMC9821539  PMID: 36614385

Abstract

The vapor pressure values of common elements are available in the literature over a limited temperature range and the accuracy and reliability of the reported data are not generally available. We evaluate the reliability and uncertainty of the available vapor pressure versus temperature data of fifty common pure elements and recommend vapor pressure versus temperature relations. By synthesizing the vapor pressure values from measurements reported in the literature with the values computed using the Clausius Clapeyron relation beyond the boiling point, we extend the vapor pressure range from 10−8 atm to 10 atm. We use a genetic algorithm to optimize the fitting of the vapor pressure data as a function of temperature over the extended vapor pressure range for each element. The recommended vapor pressure values are compared with the corresponding literature values to examine the reliability of the recommended values.

Keywords: vapor pressure, elevated temperature, optimization, differential evolution, evaporation

1. Introduction

The vapor pressures of elements at various temperatures are important for a wide range of scientific and engineering calculations [1,2,3,4,5,6]. Vapor pressure data are important for many metal processing operations and properties of many alloys. They are needed to predict the loss of alloying elements due to vaporization during additive manufacturing and fusion welding and for the deposition of various thin films of commercial interest [1,2,3,4,5,6]. In the keyhole mode welding and additive manufacturing processes, the relationship between temperature and vapor pressure is a requisite to predict the shape, size, and stability of the keyhole [7]. Similarly, in the pyrometallurgical production of metals, vapor pressure and the rates of evaporation of zinc and cadmium are used in the final refining steps of their extraction [8,9]. Accurate knowledge of the vapor pressure is necessary to have a vapor coating of elements [10]. In high-pressure systems such as nuclear reactors, the choice of coolants like liquid sodium or alloys of sodium-potassium and lead-bismuth is affected by their vapor pressures [11]. Therefore, an accurate database of vapor pressure for elements is needed for different scientific and technological applications.

Despite the importance of vapor pressure data, work on the vapor pressure of elements has not advanced much since the 1980s when Hultgren compiled the vapor pressure data of several elements [12]. These vapor pressure data at various temperatures were fitted by Alcock et al. [13] and Gale et al. [14], using linear regression to provide relations between vapor pressure and temperature. However, for most elements, the resulting fitted equations are valid for a narrow temperature range much below the boiling point of the liquid. For example, for Vanadium with a boiling point of 3680 K, the vapor pressure equation from Smithells Metals Handbook is only valid till 2175 K leaving a temperature range of 1505 K below the boiling point with no vapor pressure-temperature data. The second major issue is that these sources provide multiple equations to represent the change in vapor pressure for different temperature ranges. For example, while Gale et al. [14] uses two equations for several elements, Alcock et al. [13] uses two equations for each element. Finally, for several elements, the temperature which corresponds to 1 atm pressure does not match the boiling point of the elements. For example, in the case of calcium, the predicted boiling point using the Gale et al. [14] relation differs from the literature boiling point by 100 K. What is needed and currently not available are vapor pressure values of elements over a wide range of temperatures and the reliability and uncertainty of the data.

We seek to develop a single vapor pressure-temperature relation valid for a wider temperature, i.e., up to a maximum pressure of 10 atm which can also correctly predict the boiling point of the element. This work uses the experimental data reported in the literature and synthesized data using Clausius Clapeyron relation to represent vapor pressure over a large range of temperatures for fifty elements. For each of the fifty elements, the resulting vapor pressure versus temperature data was fitted into an equation. The fitting of the vapor pressure versus temperature data was optimized using a genetic algorithm (GA) and the accuracy of the fitting was evaluated. Finally, the reliability of the recommended pressure versus temperature relation was examined by comparing the recommended values with the corresponding values reported in the literature.

2. Methodology

The experimental data of vapor pressure versus temperature were collected from the literature and where data were not available, the Clausius Clapeyron thermodynamic relation was used to fill in the gaps in the available data. The resulting data were fitted to an equation for each element. The data fitting was optimized using a differential evolution (DE) algorithm [15,16,17]. The methods of data collection and data fitting optimization are discussed below.

2.1. Data Collection

We collected the vapor pressure data ranging from 10−8 atm (1.013 × 10−3 Pa) to 10 atm (1.013 × 106 Pa). The data at low pressure and temperatures below the boiling point are available in the literature [12]. These data were collected for all fifty elements [12]. The lowest pressures for which data was collected [12] is 10−8 atm because this pressure corresponds to the ultra-high vacuum achieved by most commercial equipment [18]. At high temperatures, vapor pressure data are not available. We assumed that the vapor behaves as an ideal gas and estimated the vapor pressure using the Clausius-Clapeyron equation [19] as,

ln(p1p2)=ΔHvapR(1T21T1)   (1)

where ΔHvap is the enthalpy of vaporization in J/mol and is assumed to be independent of temperature. P1 and P2 are pressures in atm, at temperatures T1 and T2 in Kelvin, respectively. Using P1 as 1 atm and T1 as the normal boiling point of an element, we calculated the pressure P2 at temperature-T2, the temperature of interest. The symbol R represents the gas constant (8.314 J/mol-K). Thus, vapor pressure data at temperatures above the boiling point were generated. Table 1 lists the boiling point and the enthalpy of vaporization of all fifty elements [20,21]. The vapor pressures were calculated using the Clausius-Clapeyron relationship up to 10 atm. The upper limit of 10 atmospheres is considered to limit the uncertainty of the predicted values.

Table 1.

Boiling points and enthalpy of vaporization of elements used in the Clausius Clapeyron equation [20,21].

Element Boiling Point (K) Enthalpy of Vaporization (kJ/mol)
Ag 2483 254
Al 2743 284
Au 3243 342
B 4203 508
Bi 1833 179
Ca 1760 153
Cd 1038 100
Ce 3743 398
Co 3173 390
Cr 2945 347
Cs 963.2 66.1
Cu 2868 305
Fe 3134 354
Ga 2673 256
Ge 3103 330
Hf 4876 648
In 2273 225
K 1047 79.1
La 3743 400
Li 1603 136
Lu 3603 414
Mg 1383 132
Mn 2373 225
Mo 4885 617
Na 1163 97.4
Nb 5017 694
Nd 3303 289
Ni 3003 379
Os 5273 678
Pb 2017 177
Pd 3233 380
Pt 4100 510
Rb 961.2 69
Re 5903 707
Rh 4000 531
Sc 3003 310
Se 958 95.5
Si 3533 383
Sm 2173 192
Sn 2893 290
Sr 1653 141
Ta 5693 753
Te 1263 114
Ti 3533 427
Tl 1733 162
V 3680 444
W 6203 774
Y 3203 390
Zn 1180 115
Zr 4650 591

Note: The data for Fe were taken from reference 21, while for rest all elements data were taken from ref. [20].

The collected vapor pressure data ranging from 10−8 atm to 10 atm were used as the input data for a genetic algorithm to determine the coefficients A, B, C, and D of an equation of the following form [13,14],

log(P)=AT+B+C ·log(T)+103·D·T   (2)

Here, T has units of Kelvin, and P is pressure in atmospheres. Genetic Algorithm optimizes the values of the four coefficients A, B, C, and D to achieve the best data fitting as discussed below.

2.2. Data Fitting Optimization Using the Differential Evolution Genetic Algorithm

The genetic algorithm (GA) used a differential evolution (DE) method that has been demonstrated in many scientific and technological problems like the determination of the ground state of Si-H crystals [16] and the determination of earthquake hypocenter [17].

Figure 1 shows schematically the various steps of the DE optimization algorithm for each element. First, DE randomly selected an initial population of A, B, C and D. Each of the population contained ten vectors to improve the accuracy of the data fitting. Each vector had four elements corresponding to the four coefficients A, B, C, and D in Equation (2). Next, additional vectors were generated through the process of mutation where an additional mutant vector can be expressed as,

V(i)mutant=Vj(i)+mf·(Vk(i)Vl(i))   (3)

where Vj,  Vk, and Vl are random initial population vectors, ‘mf’ is the mutation factor that controls the evolution of the population. The index ‘i’ corresponds to the elements in the vector (coefficients A, B, C, and D).

Figure 1.

Figure 1

The overall structure of this work. Data collected from experimental work and synthesized using the Clausius Clapeyron equation is fed to a differential evolution genetic algorithm (GA) to provide the coefficients A, B, C, and D of the vapor pressure relation. The dotted box indicates the GA algorithm.

After the mutation, the mutant vectors were combined with the initial population vector to generate a trial vector. This process is called cross-over. The trial vector was tested against the initial population vector using an objective function represented as,

f=1n(logP(AT+B+C logT+103DT))2  (4)

where f is the sum of the squared difference between vapor pressure (P), and the values calculated by the coefficients from the differential evolution algorithm, and ‘n’ is the number of data points. ‘f’ also indicates the fitness value for each population. For the comparison of the initial population vector against the trial vector, the vector with the lowest value of f is kept for the next generation. This comparison is repeated for each vector of the population. When the comparison for all population vectors in a generation was concluded, the process was repeated until the total number of generations was completed. The total number of generations was chosen to be 500,000. The above process was repeated for each of the fifty elements to obtain the coefficients A, B, C, and D. The calculation was done using an in-house FORTRAN code compiled using the Intel® Fortran Compiler, ifort version 2021.7.0.

3. Results and Discussion

3.1. Improved Vapor Pressure Relation

Table 2 reports the coefficients A, B, C, and D of the vapor pressure-temperature relation (shown in Equation (2)) for fifty elements. These coefficients were derived using the genetic algorithm method of optimization as explained earlier. Figure 2 shows an example of the optimization of the fitting using the element silicon. In this figure, the blue line represents the vapor pressure-temperature relation between 1700 K and 4300 K. This blue line is generated from the vapor pressure versus temperature data using its coefficients A, B, C, and D (Table 2) in Equation 2 obtained using a genetic algorithm. The black triangles represent the experimental vapor pressure data between the temperature of 1700 K and 3400 K taken from Hultgren’s handbook [12]. The vapor pressure data synthesized using the Clausius Clapeyron equation and the enthalpy of vaporization and boiling point information [20] is shown by the red circles in the plot (Figure 2). The first red circle represents the boiling point (3533 K) corresponding to 1 atm pressure and the last circle corresponds to a pressure near 10 atm, i.e., a temperature of 4300 K. This combined experimental and synthesized vapor pressure data of Si represented by the black triangles and red circles were used in GA to calculate the coefficients of the equation. The experimental data from Hultgren et al. [12] and the corresponding fitted results using the coefficients of GA is provided in Table A1 of Appendix A. Using the coefficients for element Si, the temperature corresponding to 1 atm pressure is predicted to be the boiling point of the element which is calculated to be 3533 K. The boiling point of Si as reported in the literature [20] is 3533 K. We thus show that our single vapor pressure-temperature relation is valid for a wide temperature while also correctly predicting the boiling point of the element.

Table 2.

Recommended coefficients for the vapor pressure of elements expressed by logP=AT+B+C logT+103DT where P is pressure in atm and T is the temperature in K.

Element A B C D Temperature Range (K) RMSE
Ag 21,330 65.78 −18.16 1.8 1100 to 3050 0.051
Al 12,210 −27.06 10.09 −1.16 1200 to 3370 0.062
Au 29,920 85.62 −23.53 1.913 1400 to 3975 0.100
B 31,710 22.78 −4.39 0.1608 2000 to 5000 0.001
Bi 10,430 10.7 −1.582 0.079 800 to 2280 0.060
Ca 11,610 34.36 −9.137 1.076 700 to 2255 0.024
Cd 6994 28.33 −7.699 1.57 420 to1300 0.016
Ce 22,390 9.125 −0.869 −0.010 1600 to 4575 0.039
Co 25,540 35.6 −8.461 0.652 1500 to 3750 0.043
Cr 21,790 15.86 −2.420 −0.024 1400 to 3525 0.010
Cs 4393 15.66 −3.973 0.782 400 to 1340 0.032
Cu 21,650 46.72 −12.26 1.124 1200 to 3500 0.105
Fe 27,180 50.1 −12.62 0.8586 1400 to 3775 0.003
Ga 25,040 96.49 −27.48 2.637 1050 to 3350 0.330
Ge 82,050 386.3 −110.7 8.599 1500 to 3750 0.370
Hf 45,980 84.44 −22.19 1.402 2200 to 5675 0.093
In 6714 −44.24 15.23 −1.726 1000 to 2790 0.365
K 4941 12.69 −2.79 0.436 400 to 1410 0.021
La 21,470 2.473 1.067 −0.147 1600 to 4575 0.010
Li 6416 −17.58 7.536 −1.604 700 to 2075 0.087
Lu 29,330 58.79 −15.47 1.214 1600 to 4325 0.054
Mg 12,040 67.15 −20.14 3.482 600 to 1730 0.035
Mn 23,600 85.49 −23.92 2.191 1000 to 3000 0.118
Mo 40,260 43.96 −10.43 0.565 2200 to 5760 0.022
Na 5764 11.19 −2.152 0.316 500 to1510 0.023
Nb 45,520 48.26 −11.41 0.606 2400 to 5800 0.051
Nd 18,880 25.2 −5.937 0.427 1290 to 4225 0.074
Ni −4552 −165.9 51.135 −4.476 1500 to 3525 0.055
Os 34,690 −21.13 8.276 −0.587 2600 to 6200 0.092
Pb 9985 7.673 −0.834 0.016 800 to 2600 0.009
Pd 25,800 55.09 −14.655 1.337 1400 to 3875 0.028
Pt 31,660 24.88 −5.016 0.235 1900 to 4850 0.001
Rb 3735 −2.693 2.567 −1.123 400 to1325 0.035
Re 50,300 52.63 −12.51 0.521 2800 to 7025 0.052
Rh 26,670 2.401 1.319 −0.119 2000 to 4720 0.199
Sc 16,750 −12.21 5.808 −0.802 1400 to 3700 0.121
Se 6532 24.87 −6.464 1.272 500 to 1190 0.003
Si 17,250 −15.97 6.403 −0.5281 1700 to 4300 0.064
Sm 19,140 91.49 −26.8 3.113 800 to 2800 0.289
Sn 15,900 7.795 −0.674 0.012 1200 to 3600 0.014
Sr 9654 23.6 −5.883 0.711 830 to 2125 0.010
Ta 47,320 34.75 −7.534 0.326 2800 to 6650 0.066
Te 12,440 73.85 −22.01 3.371 600 to 1625 0.349
Ti 26,910 28.53 −6.305 0.413 1600 to 4190 0.080
Tl 8591 −0.38 1.895 −0.461 700 to 2200 0.012
V 37,240 73.27 −18.97 1.221 1800 to 4375 0.160
W 83,040 151.1 −38.85 1.551 3000 to7325 0.262
Y −18,360 −246.3 74.075 −5.968 1500 to 3800 0.171
Zn 8681 36.95 −10.36 1.888 500 to1475 0.020
Zr 28,580 −0.651 1.95 −0.076 2200 to 5475 0.031

Figure 2.

Figure 2

(a) A plot of vapor pressure with temperature for Silicon (Si). The coefficients A = 17,250, B = −15.97, C = 6.403 and D = −0.5281 shown in Table 2 are used in Equation (2) to generate the blue curve in this plot. The region marked by the rectangle is shown separately in 2(b). (b) Enlarged section of the vapor pressure data between 1500 K and 3500 K shows a good fit with the equation. The experimental data from Hultgren et al. [12] and the fitting results between 1700 K and 3400 K are tabulated in the Appendix A.

To represent the utility of the relation for the entire range of pressure, a root mean square error (RMSE) is provided along with the coefficients in Table 2. RMSE is calculated based on the difference between the vapor pressure versus temperature relation using the optimized coefficients and the pressure that was calculated in data collection stage is represented as

RMSE=1n(PlitPGA)2n     (5)

where Plit corresponds to the pressure obtained from literature or using Clausius Clapeyron relation. PGA is the pressure calculated using the coefficients provided by GA and n is the number of data points. RMSE for the fifty elements are provided in Table 2.

The variation of vapor pressure with temperature for five commonly used elements of Mg, Al, Ni, Fe, and Ti are obtained using the coefficients generated from this study (Table 2) and is shown in Figure 3.

Figure 3.

Figure 3

The variation of vapor pressure with temperature for five commonly used elements of Mg, Al, Ni, Fe, and Ti using the coefficients generated from this study (Table 2) in Equation (2).

We show that a single relation is sufficient to represent the entire range of vapor pressure even for the elements for which two or more relations were needed. For example, Gale et al. [14] used two equations to define the vapor pressure of Zn between 500 and 1000 K, where one equation was for 473 K to 692.5 K and the other was for 692.5 K to 1000 K. These two relations are represented by the black squares and red circles in Figure 4, respectively. Here, we provide a single equation, represented by the blue line, that can be used to describe the vapor pressure over the entire temperature range of 500 to 1475 K accurately. Thus, the coefficients for Zn derived from GA are valid from 500 K to 1475 K and provide vapor pressure with a mean absolute error of 4.44 × 10−4 atm (Figure 4).

Figure 4.

Figure 4

(a) A plot of the vapor pressure data of Zn using data from the handbook and the coefficients generated in this study. While Gale et al. [14] provides two different relations denoted by the black squares (between the temperature of 473 K to 692.5 K) and red circles (temperature of 692. K to 1000 K), our work represents the variation in vapor pressure data using a single relation. (b) The enlarged section of the low-temperature vapor pressure data between 400 K and 1000 K shows a good fit with the equation.

The average fitness error (F) that represents the soundness of the data fitting by GA for each generation is calculated as

F=1N 1Nf  (6)

where ‘N’ is the number of populations and ‘f’ is calculated using Equation (4). A plot of the average fitness error as a function of number of generations for Si is shown in Figure 5. Fitness error decreases rapidly from 8 × 105 for the initial population to 922, 16, 0.46, and 0.01 in the 30th, 100th 1000th, and 10,000th generation, respectively, and finally to 0.002 at the end of the 50,000th generation. This indicates that the GA converges rapidly and provides a very good fitting indicated by the low fitness error. The relations provided by GA are tested using independent experimental data as discussed below.

Figure 5.

Figure 5

A plot showing the decrease in fitness function with the number of generations for Silicon (Si).

3.2. Verification with Data

To test the results of our approach, independent data (other than the handbook [12]) were also used to examine the accuracy of the relations provided by GA. It is seen that for element Li, the results from GA not only follow the same trend as that reported by Kondo et al. [22], but it can also provide data up to a much higher temperature (Figure 6) with a mean absolute error of 1.25 × 10−2 atm.

Figure 6.

Figure 6

(a) A Comparison of the vapor pressure of Li using coefficients generated using our method (GA) and that of Kondo et al. [22]. (b) The enlarged section of the vapor pressure data between 400 K and 1600 K shows the good fit with the equation.

3.3. Quantification of Uncertainty and Reliability of Our Results

Pressure predicted using the coefficients provided by GA is compared with the experimental value. The uncertainty in prediction is represented using the following relation:

U=(PcalPexp)Pexp×100  (7)

Pcal is the pressure predicted using the coefficients A, B, C, and D in Equation (2) and Pexp is the experimental pressure collected from [12]. Using element Pb as an example (Figure 7), we find that the pressure predicted (Pcal) is within 3% of the experimental value.

Figure 7.

Figure 7

The differences in the vapor pressure data of the recommended relation and that using the previous relation Gale et al. [14] from the experimental data of Hultgren et al. [12] for Pb.

The reliability of our proposed equation of vapor pressure can be evaluated by comparing the vapor pressure values computed using our equation with the vapor pressure values in the literature. The calculated values of the vapor pressure of Pb (Figure 8) are compared with those computed using the coefficients provided by Alcock et al. [13] and Gale et al. [14]. The data are available between 600 K and 1200 K in Alcock et al. [13]. and from 600 K to 2030 K in Gale et al. [14]. The coefficients are valid between 600 K and 2600 K. Figure 8 shows that our data is within the range of the data available in the literature. Therefore, our data is reliable as well as covers a wider range of temperatures that is not currently available in the literature.

Figure 8.

Figure 8

(a) Evaluation of reliability of the proposed equation for calculating vapor pressure. Here, we consider Pb as an example for which data are available between 600 K and 1200 K in works of Alcock et al. [13] and Gale et al. [14] in the range 600 K to 2030 K. (b) A zoomed in version of figure (a) within the temperature range of 600 K to 1200 K and between 0 atm and 1 × 10−4 atm vapor pressure.

3.4. Sources of Error

GA is a robust tool to fit non-linear, non-differentiable functions, and the accuracy of the fit can depend on various factors such as the number of generations, initial population size, cross-over ratio, and mutation factor. This approach of data fitting using GA may contribute to some errors. We were able to minimize the error from GA by choosing a large number of generations as 50,000. In addition, it is evident from Figure 4 that the fitness error reaches a low value of 0.002 atm at the end of the calculations ensuring a good fit.

Since both experimental data and data from the Clausius Clapeyron relation are used as inputs in GA, incorrect experimental data can also result in errors. Often the experiments for vapor pressure data were not available for high-purity elements. For example, vapor pressure measurements are available for commercially pure elements which often contain impurities. The presence of a substantial level of impurity in the element of interest indicates that the measured vapor pressure may not reflect the correct vapor pressure of the element unless they are corrected [23].

4. Summary and Conclusions

We synthesize vapor pressure data from the literature and use the Clausius Clapeyron relation to provide the vapor pressure versus temperature relations for fifty elements. The relations are applicable for a wide range of temperatures and provide vapor pressure from 10−8 atm (1.013 × 10−3 Pa) to 10 atm (1.013 × 106 Pa) with a very low root mean square error in the order of 10−2 atm. We found that the vapor pressure values computed using the relations are consistent with the independent experimental data. In addition, the relations are capable of predicting the boiling points of elements accurately. Finally, the relations are found to be reliable in predicting the vapor pressure with a maximum deviation of 10−3 atm pressure from the existing database.

Appendix A

Table A1 indicates the difference between the experimental data [12] and the fitting results in Figure 2 between 1700 K and 3400 K. The coefficients A = 17,250, B = −15.97, C = 6.403 and D = −0.5281 shown in Table 2 are used in Equation (2) to generate the fitting results. A good agreement between the experimental data and the fitting results is observed.

Table A1.

Comparison between the experimental data [12] and the fitting results in Figure 2 between 1700 K and 3400 K.

Temperature, K Experimentally Measured Vapor Pressure, Atm Vapor Pressure from the Fitted Equation, Atm
1700 4.5 × 10−7 4.67 × 10−7
1800 2.15 × 10−6 2.19 × 10−6
1900 8.74 × 10−6 8.74 × 10−6
2000 3.07 × 10−5 3.06 × 10−5
2200 2.7 × 10−4 2.68 × 10−4
2400 0.00164 0.00165
2600 0.00752 0.00773
2800 0.0278 0.02902
3000 0.0862 0.09114
3200 0.231 0.24713
3400 0.552 0.59291

Author Contributions

Conceptualization, B.M. and T.D.; methodology, B.M.; software, B.M.,T.M., N.W.F., A.S., M.Z.G., T.D.; validation, B.M.,T.M., N.W.F., A.S., M.Z.G.; formal analysis, B.M.,T.M., N.W.F., A.S., M.Z.G.; investigation, B.M., T.M., N.W.F., A.S., M.Z.G.; resources, T.D.; data curation, B.M., T.M., N.W.F., A.S., M.Z.G.; writing—original draft preparation, B.M.; writing—review and editing, B.M.,T.M., N.W.F., and T.D.; visualization, B.M. and T.M.; supervision, T.D.; project administration, T.D., and T.A.P.; All authors have read and agreed to the published version of the manuscript.

Institutional Review Board Statement

Not applicable.

Informed Consent Statement

Not applicable.

Data Availability Statement

Not applicable.

Conflicts of Interest

The authors declare no conflict of interest.

Funding Statement

This research received no external funding.

Footnotes

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