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. 2023 Feb 1;614(7946):48–53. doi: 10.1038/s41586-022-05478-3

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© The Author(s) 2023

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — Event rate (left) and ratio to the post-fit model (right). The vertical error bars around the data points and the error band around the model prediction account for statistical uncertainty (stat. unc.) based on the standard deviation of a Poisson distribution. Note that the (0,0.0125) (GeV/c)² and (6.0,10) (GeV/c)² bins are not reported due to low statistics. DIS refers to deep inelastic scattering.